Croon J.
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Библиография книг автора
Croon J.
Maes H.
Sansen W.
Matching Properties of Deep Sub-Micron MOS Transistors (The International Series in Engineering and Computer Science)
Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield....
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