Информация об авторе

Wen X.


Библиография книг автора

VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon) Wang L. Wen X. Wu C.
VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability....
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